My KWIN fork where I work on features like per-output virtual desktops

Martin Gräßlin f99492a616 [autotest] Try to make TestWaylandOutputDevice a little bit more robust ... From time to time the test is failing on build.kde.org with an ASAN heap-use-after-free error. From my investigation this seems to be caused by the OutputDevice being constructed on the stack and being destroyed while handling Wayland events, but before all are handled. The test mostly operates on the changed signal. There is also a done signal emitted later on. Wayland sends the done after a set of changes is transmitted. Thus the test is adjusted to wait for done instead of changed. So we can ensure that all events are handled before the object gets destroyed. I have never been able to reproduce the problem locally, so I cannot guarantee that the issue is solved for good. If it still happens more investigation will be needed.		2016-05-17 13:36:56 +02:00
src/wayland	[autotest] Try to make TestWaylandOutputDevice a little bit more robust	2016-05-17 13:36:56 +02:00